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Materials Processing/Synthesis
Materials Characterization
Resources
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KTH Resources School Wise
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Materials Characterization
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Other Characterization
Other Characterization
Name
Model
Manufacturer
Responsible group name
Details
M11 Nikon/CD 1
OPTISHOT/Linjebreddsmätare
Nikon
EKT
Details
LEITZ
Thin film interferometry,
LEITZ MPV-SP
QLA-Nanoteknik
Details
Dektak
Dektak3ST
ST
QLA-Nanoteknik
Details
Optical profilometer
Wyko NT9300
Veeco
MST
Details
Kemvåg
?
?
Nano-QLA
Details
UVISEL Spectroscopic Ellipsometry
UVISEL ER
HORIBA
EKT